Lee, J., Venkateswaran, S., & Choi, M. (2012). Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliability. IET computers & digital techniques, 6(4), 214-222. https://doi.org/10.1049/iet-cdt.2011.0025
Citácia podle Chicago (17th ed.)Lee, J.-S, S. Venkateswaran, a M. Choi. "Efficient Post-configuration Testing of an Asynchronous Nanowire Crossbar System for Reliability." IET Computers & Digital Techniques 6, no. 4 (2012): 214-222. https://doi.org/10.1049/iet-cdt.2011.0025.
Citácia podľa MLA (8th ed.)Lee, J.-S, et al. "Efficient Post-configuration Testing of an Asynchronous Nanowire Crossbar System for Reliability." IET Computers & Digital Techniques, vol. 6, no. 4, 2012, pp. 214-222, https://doi.org/10.1049/iet-cdt.2011.0025.
Upozornenie: Tieto citáce sú generované automaticky. Nemusia byť úplne správne podľa citačných pravidiel..