APA (7th ed.) Citation

Stratigopoulos, H., & Makris, Y. (2008). Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing. IEEE transactions on computer-aided design of integrated circuits and systems, 27(2), 339-351. https://doi.org/10.1109/TCAD.2007.907232

Chicago Style (17th ed.) Citation

Stratigopoulos, H.-G, and Y. Makris. "Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems 27, no. 2 (2008): 339-351. https://doi.org/10.1109/TCAD.2007.907232.

MLA (9th ed.) Citation

Stratigopoulos, H.-G, and Y. Makris. "Error Moderation in Low-Cost Machine-Learning-Based Analog/RF Testing." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, vol. 27, no. 2, 2008, pp. 339-351, https://doi.org/10.1109/TCAD.2007.907232.