Physical Layer Security in wireless sensors networks with friendly jammer: Secrecy Outage Probability Analysis

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Vydáno v:Advances in electrical and electronic engineering Ročník 22; číslo 4
Hlavní autoři: MINH, Bui Vu, NHAN, N.H.K., PHAM, Thu-Ha Thi, Tran, Minh, KIM, Sung-Won
Médium: Journal Article
Jazyk:angličtina
Vydáno: 31.12.2024
ISSN:1336-1376, 1804-3119
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Author MINH, Bui Vu
Tran, Minh
NHAN, N.H.K.
KIM, Sung-Won
PHAM, Thu-Ha Thi
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