MINH, B. V., NHAN, N., PHAM, T. T., Tran, M., & KIM, S. (2024). Physical Layer Security in wireless sensors networks with friendly jammer: Secrecy Outage Probability Analysis. Advances in electrical and electronic engineering, 22(4), . https://doi.org/10.15598/aeee.v22i4.5840
Chicago Style (17th ed.) CitationMINH, Bui Vu, N.H.K NHAN, Thu-Ha Thi PHAM, Minh Tran, and Sung-Won KIM. "Physical Layer Security in Wireless Sensors Networks with Friendly Jammer: Secrecy Outage Probability Analysis." Advances in Electrical and Electronic Engineering 22, no. 4 (2024). https://doi.org/10.15598/aeee.v22i4.5840.
MLA (9th ed.) CitationMINH, Bui Vu, et al. "Physical Layer Security in Wireless Sensors Networks with Friendly Jammer: Secrecy Outage Probability Analysis." Advances in Electrical and Electronic Engineering, vol. 22, no. 4, 2024, https://doi.org/10.15598/aeee.v22i4.5840.