Color three-dimensional imaging based on patterned illumination using a negative pinhole array
Reflectance confocal microscopy is widely used for non-destructive optical three-dimensional (3D) imaging. In confocal microscopy, a stack of sequential two-dimensional (2D) images with respect to the axial position is typically needed to reconstruct a 3D image. As a result, in conventional confocal...
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| Published in: | Optics express Vol. 29; no. 5; p. 6509 |
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| Main Authors: | , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
United States
01.03.2021
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| ISSN: | 1094-4087, 1094-4087 |
| Online Access: | Get full text |
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