Color three-dimensional imaging based on patterned illumination using a negative pinhole array

Reflectance confocal microscopy is widely used for non-destructive optical three-dimensional (3D) imaging. In confocal microscopy, a stack of sequential two-dimensional (2D) images with respect to the axial position is typically needed to reconstruct a 3D image. As a result, in conventional confocal...

Full description

Saved in:
Bibliographic Details
Published in:Optics express Vol. 29; no. 5; p. 6509
Main Authors: Kim, Chang-Soo, Kim, Junyoung, Yoo, Hongki
Format: Journal Article
Language:English
Published: United States 01.03.2021
ISSN:1094-4087, 1094-4087
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first