APA (7th ed.) Citation

Hu, Q., Ye, Z., & Zhang, Y. (2025). Frequent grounding fault location technology for multi-bamboo line pressing based on recursive bayesian algorithm. Journal of physics. Conference series, 2996(1), 12001-12006. https://doi.org/10.1088/1742-6596/2996/1/012001

Chicago Style (17th ed.) Citation

Hu, Qian, Zhijian Ye, and Yao Zhang. "Frequent Grounding Fault Location Technology for Multi-bamboo Line Pressing Based on Recursive Bayesian Algorithm." Journal of Physics. Conference Series 2996, no. 1 (2025): 12001-12006. https://doi.org/10.1088/1742-6596/2996/1/012001.

MLA (9th ed.) Citation

Hu, Qian, et al. "Frequent Grounding Fault Location Technology for Multi-bamboo Line Pressing Based on Recursive Bayesian Algorithm." Journal of Physics. Conference Series, vol. 2996, no. 1, 2025, pp. 12001-12006, https://doi.org/10.1088/1742-6596/2996/1/012001.