Wu, K., Long, B., Bu, Z., Wang, J., & Liu, Z. (2025). A Novel General Feature Enhancement Method Based on Genetic Programming for Improving RF Circuit Fault Diagnosis Using Machine Learning. Circuits, systems, and signal processing, 44(12), 8877-8900. https://doi.org/10.1007/s00034-025-03232-4
Citácia podle Chicago (17th ed.)Wu, Kunping, Bing Long, Zhiyuan Bu, Jingyuan Wang, a Zhen Liu. "A Novel General Feature Enhancement Method Based on Genetic Programming for Improving RF Circuit Fault Diagnosis Using Machine Learning." Circuits, Systems, and Signal Processing 44, no. 12 (2025): 8877-8900. https://doi.org/10.1007/s00034-025-03232-4.
Citácia podľa MLA (8th ed.)Wu, Kunping, et al. "A Novel General Feature Enhancement Method Based on Genetic Programming for Improving RF Circuit Fault Diagnosis Using Machine Learning." Circuits, Systems, and Signal Processing, vol. 44, no. 12, 2025, pp. 8877-8900, https://doi.org/10.1007/s00034-025-03232-4.