Wu, K., Long, B., Bu, Z., Wang, J., & Liu, Z. (2025). A Novel General Feature Enhancement Method Based on Genetic Programming for Improving RF Circuit Fault Diagnosis Using Machine Learning. Circuits, systems, and signal processing, 44(12), 8877-8900. https://doi.org/10.1007/s00034-025-03232-4
Chicago Style (17th ed.) CitationWu, Kunping, Bing Long, Zhiyuan Bu, Jingyuan Wang, and Zhen Liu. "A Novel General Feature Enhancement Method Based on Genetic Programming for Improving RF Circuit Fault Diagnosis Using Machine Learning." Circuits, Systems, and Signal Processing 44, no. 12 (2025): 8877-8900. https://doi.org/10.1007/s00034-025-03232-4.
MLA (9th ed.) CitationWu, Kunping, et al. "A Novel General Feature Enhancement Method Based on Genetic Programming for Improving RF Circuit Fault Diagnosis Using Machine Learning." Circuits, Systems, and Signal Processing, vol. 44, no. 12, 2025, pp. 8877-8900, https://doi.org/10.1007/s00034-025-03232-4.