Ghosh, R., Provias, A., Karl, A., Wilhelmer, C., Knobloch, T., Davoudi, M. R., . . . Grasser, T. (2025). Theoretical insights into the impact of border and interface traps on hysteresis in monolayer MoS2 FETs. Microelectronic engineering, 299, 112333. https://doi.org/10.1016/j.mee.2025.112333
Citace podle Chicago (17th ed.)Ghosh, Rittik, Alexandros Provias, Alexander Karl, Christoph Wilhelmer, Theresia Knobloch, Mohammad Rasool Davoudi, Seyed Mehdi Sattari-Esfahlan, Dominic Waldhör, a Tibor Grasser. "Theoretical Insights into the Impact of Border and Interface Traps on Hysteresis in Monolayer MoS2 FETs." Microelectronic Engineering 299 (2025): 112333. https://doi.org/10.1016/j.mee.2025.112333.
Citace podle MLA (9th ed.)Ghosh, Rittik, et al. "Theoretical Insights into the Impact of Border and Interface Traps on Hysteresis in Monolayer MoS2 FETs." Microelectronic Engineering, vol. 299, 2025, p. 112333, https://doi.org/10.1016/j.mee.2025.112333.