Liu, T., Zhu, K., & Zeng, L. (2018). Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model. IEEE/ASME transactions on mechatronics, 23(3), 1456-1466. https://doi.org/10.1109/TMECH.2018.2823320
Citácia podle Chicago (17th ed.)Liu, Tongshun, Kunpeng Zhu, a Liangcai Zeng. "Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model." IEEE/ASME Transactions on Mechatronics 23, no. 3 (2018): 1456-1466. https://doi.org/10.1109/TMECH.2018.2823320.
Citácia podľa MLA (8th ed.)Liu, Tongshun, et al. "Diagnosis and Prognosis of Degradation Process via Hidden Semi-Markov Model." IEEE/ASME Transactions on Mechatronics, vol. 23, no. 3, 2018, pp. 1456-1466, https://doi.org/10.1109/TMECH.2018.2823320.
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