Shim, J., Kang, S., & Cho, S. (2021). Active cluster annotation for wafer map pattern classification in semiconductor manufacturing. Expert systems with applications, 183, 115429. https://doi.org/10.1016/j.eswa.2021.115429
Citace podle Chicago (17th ed.)Shim, Jaewoong, Seokho Kang, a Sungzoon Cho. "Active Cluster Annotation for Wafer Map Pattern Classification in Semiconductor Manufacturing." Expert Systems with Applications 183 (2021): 115429. https://doi.org/10.1016/j.eswa.2021.115429.
Citace podle MLA (9th ed.)Shim, Jaewoong, et al. "Active Cluster Annotation for Wafer Map Pattern Classification in Semiconductor Manufacturing." Expert Systems with Applications, vol. 183, 2021, p. 115429, https://doi.org/10.1016/j.eswa.2021.115429.
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