APA (7th ed.) Citation

Shim, J., Kang, S., & Cho, S. (2021). Active cluster annotation for wafer map pattern classification in semiconductor manufacturing. Expert systems with applications, 183, 115429. https://doi.org/10.1016/j.eswa.2021.115429

Chicago Style (17th ed.) Citation

Shim, Jaewoong, Seokho Kang, and Sungzoon Cho. "Active Cluster Annotation for Wafer Map Pattern Classification in Semiconductor Manufacturing." Expert Systems with Applications 183 (2021): 115429. https://doi.org/10.1016/j.eswa.2021.115429.

MLA (9th ed.) Citation

Shim, Jaewoong, et al. "Active Cluster Annotation for Wafer Map Pattern Classification in Semiconductor Manufacturing." Expert Systems with Applications, vol. 183, 2021, p. 115429, https://doi.org/10.1016/j.eswa.2021.115429.