Enhancing defect detection in additive manufacturing using a conditional autoencoder with skip connections and in situ infrared sensing
Developing reliable and efficient defect detection strategies for additive manufacturing (AM) is critical to advancing its adoption in industrial environments. To this end, studies have focused on constructing defect detection frameworks combining unsupervised anomaly detection algorithms and sensor...
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| Vydané v: | Journal of manufacturing processes Ročník 156; s. 268 - 283 |
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| Hlavní autori: | , , , , |
| Médium: | Journal Article |
| Jazyk: | English |
| Vydavateľské údaje: |
Elsevier Ltd
26.12.2025
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| Predmet: | |
| ISSN: | 1526-6125 |
| On-line prístup: | Získať plný text |
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