APA (7th ed.) Citation

Yang, M., Yang, S., & Bian, C. (2024). Software Reliability Prediction by Adaptive Gated Recurrent Unit‐Based Encoder‐Decoder Model With Ensemble Empirical Mode Decomposition. Software testing, verification & reliability, 34(8), -n/a. https://doi.org/10.1002/stvr.1895

Chicago Style (17th ed.) Citation

Yang, Minghao, Shunkun Yang, and Chong Bian. "Software Reliability Prediction by Adaptive Gated Recurrent Unit‐Based Encoder‐Decoder Model With Ensemble Empirical Mode Decomposition." Software Testing, Verification & Reliability 34, no. 8 (2024): -n/a. https://doi.org/10.1002/stvr.1895.

MLA (9th ed.) Citation

Yang, Minghao, et al. "Software Reliability Prediction by Adaptive Gated Recurrent Unit‐Based Encoder‐Decoder Model With Ensemble Empirical Mode Decomposition." Software Testing, Verification & Reliability, vol. 34, no. 8, 2024, pp. -n/a, https://doi.org/10.1002/stvr.1895.

Warning: These citations may not always be 100% accurate.