Yang, M., Yang, S., & Bian, C. (2024). Software Reliability Prediction by Adaptive Gated Recurrent Unit‐Based Encoder‐Decoder Model With Ensemble Empirical Mode Decomposition. Software testing, verification & reliability, 34(8), -n/a. https://doi.org/10.1002/stvr.1895
Chicago Style (17th ed.) CitationYang, Minghao, Shunkun Yang, and Chong Bian. "Software Reliability Prediction by Adaptive Gated Recurrent Unit‐Based Encoder‐Decoder Model With Ensemble Empirical Mode Decomposition." Software Testing, Verification & Reliability 34, no. 8 (2024): -n/a. https://doi.org/10.1002/stvr.1895.
MLA (9th ed.) CitationYang, Minghao, et al. "Software Reliability Prediction by Adaptive Gated Recurrent Unit‐Based Encoder‐Decoder Model With Ensemble Empirical Mode Decomposition." Software Testing, Verification & Reliability, vol. 34, no. 8, 2024, pp. -n/a, https://doi.org/10.1002/stvr.1895.