Burns, K., Kohnert, C., Li, N., Scott, M. C., & Hattar, K. (2023). Data Driven In Situ TEM: A Path Towards Accurate Characterization of Radiation Damage in Structural Materials. Microscopy and microanalysis, 29(Supplement_1), 1555. https://doi.org/10.1093/micmic/ozad067.800
Citácia podle Chicago (17th ed.)Burns, Kory, Caitlin Kohnert, Nan Li, Mary C. Scott, a Khalid Hattar. "Data Driven In Situ TEM: A Path Towards Accurate Characterization of Radiation Damage in Structural Materials." Microscopy and Microanalysis 29, no. Supplement_1 (2023): 1555. https://doi.org/10.1093/micmic/ozad067.800.
Citácia podľa MLA (8th ed.)Burns, Kory, et al. "Data Driven In Situ TEM: A Path Towards Accurate Characterization of Radiation Damage in Structural Materials." Microscopy and Microanalysis, vol. 29, no. Supplement_1, 2023, p. 1555, https://doi.org/10.1093/micmic/ozad067.800.