Yeh, W. (2025). Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS. Reliability engineering & system safety, 264, 111446. https://doi.org/10.1016/j.ress.2025.111446
Citácia podle Chicago (17th ed.)Yeh, Wei-Chang. "Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS." Reliability Engineering & System Safety 264 (2025): 111446. https://doi.org/10.1016/j.ress.2025.111446.
Citácia podľa MLA (8th ed.)Yeh, Wei-Chang. "Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS." Reliability Engineering & System Safety, vol. 264, 2025, p. 111446, https://doi.org/10.1016/j.ress.2025.111446.
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