Yeh, W. (2025). Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS. Reliability engineering & system safety, 264, 111446. https://doi.org/10.1016/j.ress.2025.111446
Chicago-Zitierstil (17. Ausg.)Yeh, Wei-Chang. "Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS." Reliability Engineering & System Safety 264 (2025): 111446. https://doi.org/10.1016/j.ress.2025.111446.
MLA-Zitierstil (9. Ausg.)Yeh, Wei-Chang. "Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS." Reliability Engineering & System Safety, vol. 264, 2025, p. 111446, https://doi.org/10.1016/j.ress.2025.111446.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.