APA (7th ed.) Citation

Yeh, W. (2025). Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS. Reliability engineering & system safety, 264, 111446. https://doi.org/10.1016/j.ress.2025.111446

Chicago Style (17th ed.) Citation

Yeh, Wei-Chang. "Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS." Reliability Engineering & System Safety 264 (2025): 111446. https://doi.org/10.1016/j.ress.2025.111446.

MLA (9th ed.) Citation

Yeh, Wei-Chang. "Enhancing Binary-State Network Reliability with Layer-Cut BAT-MCS." Reliability Engineering & System Safety, vol. 264, 2025, p. 111446, https://doi.org/10.1016/j.ress.2025.111446.