On-Line Fault Monitoring
Sequoia's fault-tolerant computers were designed subject to some rather rigid constraints: No single hardware malfunction can generate an undetected error; an integrated circuit is a "black box" that can fail in arbitrary ways, affecting an arbitrary subset of input and output signals...
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| Published in: | Journal of electronic testing Vol. 12; no. 1-2; pp. 21 - 27 |
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| Main Author: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
Boston
Springer Nature B.V
01.02.1998
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| ISSN: | 0923-8174, 1573-0727 |
| Online Access: | Get full text |
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| Abstract | Sequoia's fault-tolerant computers were designed subject to some rather rigid constraints: No single hardware malfunction can generate an undetected error; an integrated circuit is a "black box" that can fail in arbitrary ways, affecting an arbitrary subset of input and output signals; faults can be transient or intermittent with arbitrary durations and repetition intervals. Moreover, the incremental hardware to be used to achieve these goals was to be kept to a minimum. The resulting computers do, to a very large extent, satisfy these constraints. To achieve this, a combination of fault-monitoring techniques was used, including: Bit and nibble error-correcting and error-detecting codes; byte parity codes with orthogonal partitioning; cyclic-residue codes on I/O data transfers; codes designed to protect against address counter overruns on I/O transfers; lossless control-signal compactors. The nature and rationale for these various fault monitors is described as well as the analytical and testing techniques used to estimate the resulting coverage.[PUBLICATION ABSTRACT] |
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| AbstractList | Sequoia's fault-tolerant computers were designed subject to some rather rigid constraints: No single hardware malfunction can generate an undetected error; an integrated circuit is a `black box' that can fail in arbitrary ways, affecting an arbitrary subset of input and output signals; faults can be transient or intermittent with arbitrary durations and repetition intervals. Moreover, the incremental hardware to be used to achieve these goals was to be kept to a minimum. The resulting computers do, to a very large extent, satisfy these constraints. To achieve this, a combination of fault-monitoring techniques was used, including: Bit and nibble error-correcting and error-detecting codes; byte parity codes with orthogonal partitioning; cyclic-residue codes on I/O data transfers; codes designed to protect against address counter overruns on I/O transfers; lossless control-signal compactors. The nature and rationale for these various fault monitors is described as well as the analytical and testing techniques used to estimate the resulting coverage. Sequoia's fault-tolerant computers were designed subject to some rather rigid constraints: No single hardware malfunction can generate an undetected error; an integrated circuit is a "black box" that can fail in arbitrary ways, affecting an arbitrary subset of input and output signals; faults can be transient or intermittent with arbitrary durations and repetition intervals. Moreover, the incremental hardware to be used to achieve these goals was to be kept to a minimum. The resulting computers do, to a very large extent, satisfy these constraints. To achieve this, a combination of fault-monitoring techniques was used, including: Bit and nibble error-correcting and error-detecting codes; byte parity codes with orthogonal partitioning; cyclic-residue codes on I/O data transfers; codes designed to protect against address counter overruns on I/O transfers; lossless control-signal compactors. The nature and rationale for these various fault monitors is described as well as the analytical and testing techniques used to estimate the resulting coverage.[PUBLICATION ABSTRACT] |
| Author | Stiffler, J.J. |
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| Cites_doi | 10.1109/TC.1978.1675143 10.1002/j.1538-7305.1976.tb02067.x 10.1002/j.1538-7305.1950.tb00463.x 10.1109/TC.1982.1676038 10.1109/TC.1980.1675606 10.1109/2.17 10.1109/TC.1978.1675102 10.1109/PROC.1980.11696 10.1109/MC.1980.1653527 10.1109/TC.1972.5009007 |
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| Copyright | Kluwer Academic Publishers 1998 |
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| DOI | 10.1023/A:1008201032535 |
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| References | J.J. Metzner (154677_CR5) 1982; C-31 J.F. Wakerly (154677_CR10) 1978; C-27 E.R. Berlekamp (154677_CR3) 1980; 68 N.J.A. Sloane (154677_CR12) 1976; 55 T.R.N. Rao (154677_CR8) 1974 D.K. Pradhan (154677_CR6) 1980; C-29 R.W. Hamming (154677_CR11) 1950; 29 154677_CR1 K.M. Chandy (154677_CR2) 1972; 21 J.J. Stiffler (154677_CR9) 1978; C-27 B. Bose (154677_CR4) 1982; C-31 D.K. Pradhan (154677_CR7) 1980; 13 |
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| Title | On-Line Fault Monitoring |
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