Design and performance of a low-emittance electron gun for electron beam probe
An Electron Beam Probe (EBP) is preferable to provide a non-interceptive measurement of the transverse distribution of a dense bunched ion beam. During EBP operation, it was observed that the electron beam spot subjects to expansion when scanned across the ion beam due to the strong space charge fie...
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| Published in: | Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 1066; p. 169604 |
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| Main Authors: | , , , , , , , , , , , , , , |
| Format: | Journal Article |
| Language: | English |
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Elsevier B.V
01.09.2024
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| ISSN: | 0168-9002 |
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| Abstract | An Electron Beam Probe (EBP) is preferable to provide a non-interceptive measurement of the transverse distribution of a dense bunched ion beam. During EBP operation, it was observed that the electron beam spot subjects to expansion when scanned across the ion beam due to the strong space charge field of the ion bunch, leading to significant degradation of spatial resolution. To mitigate this effect, a small electron beam spot is beneficial as demonstrated in previous research. This paper presents design details of a low-emittance, small-spot, and long-work-distance electron gun. Geometry optimization of the gun and focus lens is conducted using a multiobjective genetic algorithm (MOGA) interfaced with space charge simulation codes to maintain normalized thermal emittance within an acceptable increase and achieve a small spot at a long work distance. The emittance is measured using a slit-screen technique, resulting in a norm. rms emittance of 0.046(+-0.005) um*rad under low beam current conditions (50 nA). In high-resolution mode, a beam spot size of 0.6 mm (rms) is achieved at a work distance of 1.2 m with the combination of Einzel lens and solenoid. The gun has been successfully operated as part of EBP experiments for accurate and high-resolution measurement of ion beam width, demonstrating excellent agreement with wire scanner measurements with relative deviation not exceeding 1%. |
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| AbstractList | An Electron Beam Probe (EBP) is preferable to provide a non-interceptive measurement of the transverse distribution of a dense bunched ion beam. During EBP operation, it was observed that the electron beam spot subjects to expansion when scanned across the ion beam due to the strong space charge field of the ion bunch, leading to significant degradation of spatial resolution. To mitigate this effect, a small electron beam spot is beneficial as demonstrated in previous research. This paper presents design details of a low-emittance, small-spot, and long-work-distance electron gun. Geometry optimization of the gun and focus lens is conducted using a multiobjective genetic algorithm (MOGA) interfaced with space charge simulation codes to maintain normalized thermal emittance within an acceptable increase and achieve a small spot at a long work distance. The emittance is measured using a slit-screen technique, resulting in a norm. rms emittance of 0.046(+-0.005) um*rad under low beam current conditions (50 nA). In high-resolution mode, a beam spot size of 0.6 mm (rms) is achieved at a work distance of 1.2 m with the combination of Einzel lens and solenoid. The gun has been successfully operated as part of EBP experiments for accurate and high-resolution measurement of ion beam width, demonstrating excellent agreement with wire scanner measurements with relative deviation not exceeding 1%. |
| ArticleNumber | 169604 |
| Author | Chen, Yucong Li, Min Zhao, Zulong Xu, Zhiguo Mao, Ruishi Li, Juan Tang, Kai Feng, Yongchun Zhao, Tiecheng Zhou, Kai You, Yaoyao Liu, Xiaotao Li, Weilong Kang, Xincai Li, Peng |
| Author_xml | – sequence: 1 givenname: Yongchun orcidid: 0000-0001-9942-3000 surname: Feng fullname: Feng, Yongchun email: fengyongchun@impcas.ac.cn organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 2 givenname: Weilong surname: Li fullname: Li, Weilong organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 3 givenname: Yucong surname: Chen fullname: Chen, Yucong organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 4 givenname: Xincai surname: Kang fullname: Kang, Xincai organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 5 givenname: Juan surname: Li fullname: Li, Juan organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 6 givenname: Kai surname: Tang fullname: Tang, Kai organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 7 givenname: Zulong surname: Zhao fullname: Zhao, Zulong organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 8 givenname: Xiaotao surname: Liu fullname: Liu, Xiaotao organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 9 givenname: Kai surname: Zhou fullname: Zhou, Kai organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 10 givenname: Yaoyao surname: You fullname: You, Yaoyao organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 11 givenname: Min surname: Li fullname: Li, Min organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 12 givenname: Peng surname: Li fullname: Li, Peng organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 13 givenname: Zhiguo surname: Xu fullname: Xu, Zhiguo organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 14 givenname: Tiecheng surname: Zhao fullname: Zhao, Tiecheng organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China – sequence: 15 givenname: Ruishi surname: Mao fullname: Mao, Ruishi organization: Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China |
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