A parallel ETD algorithm for large-scale rate theory simulation

Rate theory (RT) is a commonly used method to simulate the evolution of material defects. A promising numerical method, exponential time difference (ETD), can reduce the stiff RT equations to explicit ordinary differential equations (ODEs). Previous implementations of ETD on the “Sunway TaihuLight”...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:The Journal of supercomputing Jg. 78; H. 12; S. 14215 - 14230
Hauptverfasser: Li, JianJiang, Li, Jiali, Yang, Yun, Ji, Baixue, Chen, Dandan, He, Xinfu, Nie, Ningming
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York Springer US 01.08.2022
Springer Nature B.V
Schlagworte:
Algorithms
Compilers
Computer Science
Differential equations
Interpreters
Iterative methods
Mathematical analysis
Numerical methods
Processor Architectures
Programming Languages
Rate theory
ETD
Rate theory
Parallel computing
ISSN:0920-8542, 1573-0484
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:Rate theory (RT) is a commonly used method to simulate the evolution of material defects. A promising numerical method, exponential time difference (ETD), can reduce the stiff RT equations to explicit ordinary differential equations (ODEs). Previous implementations of ETD on the “Sunway TaihuLight” supercomputer suffer from high computation cost and poor parallel efficiency while solving a large amount of ODEs. This paper improves the algorithm with hybrid MPI+SIMD and additional instruction-level optimizations by taking advantage of the architecture of “Sunway TaihuLight”. The execution time of a single iteration is reduced by about 40%. Scaling from 64 to 4096 processes, the parallel efficiency of the new algorithm achieves 33.5% and 50.6% in strong and weak scalability, which corresponds to 21.4 and 32.4 in speedup, respectively.
Bibliographie:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:0920-8542
1573-0484
DOI:10.1007/s11227-022-04434-2