Wang, X., Chen, J., Liang, B., Wen, Y., Shen, F., Chi, Y., . . . Yu, G. (2025). Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 nm CMOS Technology. IEEE transactions on nuclear science, 72(10), 3351-3363. https://doi.org/10.1109/TNS.2025.3598057
Citace podle Chicago (17th ed.)Wang, Xun, Jianjun Chen, Bin Liang, Yi Wen, Fan Shen, Yaqing Chi, Deng Luo, a Guofang Yu. "Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 Nm CMOS Technology." IEEE Transactions on Nuclear Science 72, no. 10 (2025): 3351-3363. https://doi.org/10.1109/TNS.2025.3598057.
Citace podle MLA (9th ed.)Wang, Xun, et al. "Single Event Transient Characterization of a Low-Dropout Regulator in a Sub-20 Nm CMOS Technology." IEEE Transactions on Nuclear Science, vol. 72, no. 10, 2025, pp. 3351-3363, https://doi.org/10.1109/TNS.2025.3598057.