Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks

This article explores the critical aspect of electronic hardware reliability analysis in reconfigurable intelligent surface (RIS)-aided networks within the context of sixth-generation (6G) communications. Recognizing the potential vulnerabilities of metasurfaces to environmental factors, we highligh...

Celý popis

Uložené v:

Podrobná bibliografia
Vydané v:	IEEE transactions on reliability Ročník 74; číslo 3; s. 3708 - 3717
Hlavní autori:	Mondal, Atiquzzaman, Singh, Keshav, Biswas, Sudip
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	New York IEEE 01.09.2025 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Predmet:	6G mobile communication Communication networks Degradation Electromagnetic properties Gamma process Hardware hardware impairment Impairment Life expectancy Maintenance Optimization Reconfigurable intelligent surfaces Reliability Reliability analysis stochastic degradation Stochastic processes Surface treatment System failures Systematics Wireless communication
ISSN:	0018-9529, 1558-1721
On-line prístup:	Získať plný text
Tagy:	Pridať tag Žiadne tagy, Buďte prvý, kto otaguje tento záznam!

Buďte prvý, kto okomentuje tento záznam!