Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks

This article explores the critical aspect of electronic hardware reliability analysis in reconfigurable intelligent surface (RIS)-aided networks within the context of sixth-generation (6G) communications. Recognizing the potential vulnerabilities of metasurfaces to environmental factors, we highligh...

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Bibliographic Details
Published in:	IEEE transactions on reliability Vol. 74; no. 3; pp. 3708 - 3717
Main Authors:	Mondal, Atiquzzaman, Singh, Keshav, Biswas, Sudip
Format:	Journal Article
Language:	English
Published:	New York IEEE 01.09.2025 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	6G mobile communication Communication networks Degradation Electromagnetic properties Gamma process Hardware hardware impairment Impairment Life expectancy Maintenance Optimization Reconfigurable intelligent surfaces Reliability Reliability analysis stochastic degradation Stochastic processes Surface treatment System failures Systematics Wireless communication
ISSN:	0018-9529, 1558-1721
Online Access:	Get full text
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