Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks

This article explores the critical aspect of electronic hardware reliability analysis in reconfigurable intelligent surface (RIS)-aided networks within the context of sixth-generation (6G) communications. Recognizing the potential vulnerabilities of metasurfaces to environmental factors, we highligh...

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Published in:IEEE transactions on reliability Vol. 74; no. 3; pp. 3708 - 3717
Main Authors: Mondal, Atiquzzaman, Singh, Keshav, Biswas, Sudip
Format: Journal Article
Language:English
Published: New York IEEE 01.09.2025
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
6G mobile communication
Communication networks
Degradation
Electromagnetic properties
Gamma process
Hardware
hardware impairment
Impairment
Life expectancy
Maintenance
Optimization
Reconfigurable intelligent surfaces
Reliability
Reliability analysis
stochastic degradation
Stochastic processes
Surface treatment
System failures
Systematics
Wireless communication
ISSN:0018-9529, 1558-1721
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Abstract This article explores the critical aspect of electronic hardware reliability analysis in reconfigurable intelligent surface (RIS)-aided networks within the context of sixth-generation (6G) communications. Recognizing the potential vulnerabilities of metasurfaces to environmental factors, we highlight the continuous hardware impairments that can significantly impact the electromagnetic properties of RISs, reducing their lifetime. Extending the life cycle of RISs is strategically important, especially in mission-critical ultra-reliable wireless applications where system failures can result in significant costs and, in extreme cases, necessitate structural replacements. Accordingly, we investigate the nonresidual continuous hardware degradation of RISs through a stochastic process and optimize maintenance strategies using statistical information to extend the RIS system's lifespan. The optimal life expectancy of the RIS system with systematic maintenance concerning the observed impairment level is demonstrated through analytical results. The findings indicate that the information-based framework can significantly extend the expected life of a RIS system by postponing maintenance. Furthermore, a comprehensive mathematical framework for reliable communication is introduced, whereby the distribution of the received SINR is determined in the presence of hardware impairment due to imperfect maintenance. Through extensive numerical simulations, the efficacy and robustness of the proposed framework under hardware impairments are illustrated.
AbstractList This article explores the critical aspect of electronic hardware reliability analysis in reconfigurable intelligent surface (RIS)-aided networks within the context of sixth-generation (6G) communications. Recognizing the potential vulnerabilities of metasurfaces to environmental factors, we highlight the continuous hardware impairments that can significantly impact the electromagnetic properties of RISs, reducing their lifetime. Extending the life cycle of RISs is strategically important, especially in mission-critical ultra-reliable wireless applications where system failures can result in significant costs and, in extreme cases, necessitate structural replacements. Accordingly, we investigate the nonresidual continuous hardware degradation of RISs through a stochastic process and optimize maintenance strategies using statistical information to extend the RIS system's lifespan. The optimal life expectancy of the RIS system with systematic maintenance concerning the observed impairment level is demonstrated through analytical results. The findings indicate that the information-based framework can significantly extend the expected life of a RIS system by postponing maintenance. Furthermore, a comprehensive mathematical framework for reliable communication is introduced, whereby the distribution of the received SINR is determined in the presence of hardware impairment due to imperfect maintenance. Through extensive numerical simulations, the efficacy and robustness of the proposed framework under hardware impairments are illustrated.
Author Mondal, Atiquzzaman
Singh, Keshav
Biswas, Sudip
Author_xml – sequence: 1
  givenname: Atiquzzaman
  orcidid: 0000-0003-0960-4583
  surname: Mondal
  fullname: Mondal, Atiquzzaman
  organization: Department of ECE, Indian Institute of Information Technology Guwahati, Guwahati, India
– sequence: 2
  givenname: Keshav
  orcidid: 0000-0001-9028-4518
  surname: Singh
  fullname: Singh, Keshav
  email: keshav.singh@mail.nsysu.edu.tw
  organization: Institute of Communications Engineering, National Sun Yat-sen University, Kaohsiung, Taiwan
– sequence: 3
  givenname: Sudip
  orcidid: 0000-0002-3017-3864
  surname: Biswas
  fullname: Biswas, Sudip
  organization: Department of ECE, Indian Institute of Information Technology Guwahati, Guwahati, India
BookMark eNpNkMFLwzAUh4NMcJuevXgIeO6WpGmbHseYOhgqdR48hTR5gcy2mUmH7L-3Yzt4ejz4fj_e-yZo1PkOELqnZEYpKefbasYI47OUC8pSeoXGNMtEQgtGR2hMCBVJmbHyBk1i3A0r56UYo69VA7oPvnMaV9A4VbvG9UesOoNXIfiA3yFYH1rVacCLTjXH6CL2Flfrj2ThDBi89G17GApU73yHX6H_9eE73qJrq5oId5c5RZ9Pq-3yJdm8Pa-Xi02iGed9IkBBkQlTqNwSYXRdMEO0TbXhQmRQlprkVOk6t8MjVjEFltiipjxnOjNapFP0eO7dB_9zgNjLnT-E4dAoU8aLjPGc5gM1P1M6-BgDWLkPrlXhKCmRJ39yW8mTP3nxNyQezgkHAP_oIs0JSdM_hwVujA
CODEN IERQAD
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2025
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2025
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
DOI 10.1109/TR.2024.3481231
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1558-1721
EndPage 3717
ExternalDocumentID 10_1109_TR_2024_3481231
10736003
Genre orig-research
GrantInformation_xml – fundername: National Science and Technology Council; National Science and Technology Council of Taiwan
  grantid: NSTC 112-2923-E-008-003-MY3; NSTC 113-2218-E-110-009
  funderid: 10.13039/100020595
GroupedDBID -~X
.DC
0R~
29I
4.4
5GY
5VS
6IK
8WZ
97E
A6W
AAJGR
AASAJ
AAWTH
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
ACNCT
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
H~9
IAAWW
IBMZZ
ICLAB
IDIHD
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
OCL
P2P
RIA
RIE
RNS
TN5
VH1
VJK
AAYXX
CITATION
7SP
8FD
ABAZT
L7M
ID FETCH-LOGICAL-c244t-8eae758d7a6f08dcb72d0cf3cd4885e99c061acb6f721fa2aef0f7b1462c5dc83
IEDL.DBID RIE
ISICitedReferencesCount 0
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=001342313700001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 0018-9529
IngestDate Sat Nov 01 14:09:15 EDT 2025
Sat Nov 29 07:34:47 EST 2025
Mon Dec 08 03:37:11 EST 2025
IsPeerReviewed true
IsScholarly true
Issue 3
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
https://doi.org/10.15223/policy-029
https://doi.org/10.15223/policy-037
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c244t-8eae758d7a6f08dcb72d0cf3cd4885e99c061acb6f721fa2aef0f7b1462c5dc83
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0003-0960-4583
0000-0002-3017-3864
0000-0001-9028-4518
PQID 3247524616
PQPubID 85456
PageCount 10
ParticipantIDs ieee_primary_10736003
crossref_primary_10_1109_TR_2024_3481231
proquest_journals_3247524616
PublicationCentury 2000
PublicationDate 2025-09-01
PublicationDateYYYYMMDD 2025-09-01
PublicationDate_xml – month: 09
  year: 2025
  text: 2025-09-01
  day: 01
PublicationDecade 2020
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on reliability
PublicationTitleAbbrev TR
PublicationYear 2025
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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– ident: ref2
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– ident: ref6
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– ident: ref15
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SSID ssj0014498
Score 2.4359312
Snippet This article explores the critical aspect of electronic hardware reliability analysis in reconfigurable intelligent surface (RIS)-aided networks within the...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Index Database
Publisher
StartPage 3708
SubjectTerms 6G mobile communication
Communication networks
Degradation
Electromagnetic properties
Gamma process
Hardware
hardware impairment
Impairment
Life expectancy
Maintenance
Optimization
Reconfigurable intelligent surfaces
Reliability
Reliability analysis
stochastic degradation
Stochastic processes
Surface treatment
System failures
Systematics
Wireless communication
Title Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks
URI https://ieeexplore.ieee.org/document/10736003
https://www.proquest.com/docview/3247524616
Volume 74
WOSCitedRecordID wos001342313700001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-1721
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0014498
  issn: 0018-9529
  databaseCode: RIE
  dateStart: 19630101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3NS8MwFA86POjBz4nTKTl48JLZpWnTHIds6GWMOWGeSj5eYJdOuk3wvzdJu7khHrwV2kLJy_v4Ne_3ewjdJxZ83c0IF1IQxigQ5SxP0kgoYx3IhliHYRN8OMymUzGqyeqBCwMAofkMOv4ynOWbuV75X2XOw3mcBm3Pfc7Tiqy1OTJgTNRh13lwQkWt49ONxONk7IAgZR1POqVxdycFhZkqvwJxyC6Dk39-1yk6rstI3Kvsfob2oDhHR1vighfovb-ZcIN943ElyP2FZWFwvyznJR79kAbwWpwEzy0ev7yS3syAwTv0ETysWsYXTfQ26E-enkk9SIFol72XJAMJDhcYLlMbZUYrTk2kbayNc98EhNAuq0utUuvwoJVUgo0sVy6IUp0YncWXqFHMC7hCWDDNrEusPIGUuVsqplppcLhGKyZN0kIP67XNPyq9jDzgjEjkk3HuzZDXZmihpl_KrceqVWyh9toYee1Qi9zVfTzx2nfp9R-v3aBD6mfzhv6vNmosyxXcogP9uZwtyruwV74BeSK-Lw
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3NS8MwFA8yBfXg58Tp1Bw8eOns0rRpjkM2NpxlzAnzVNrkBXZppdsE_3uTtJsb4sFboR-UvL6PX_N-v4fQva_A1N3UYTzhDqUEnFRb3glcnkqlQTZ4wg6bYFEUTqd8VJHVLRcGAGzzGbTMod3Ll7lYml9l2sOZF1htz11fP9Yt6VrrTQNKeRV4tQ_7hFdKPm2XP07GGgoS2jK0U-K1t5KQnaryKxTb_NI7_uebnaCjqpDEndLyp2gHsjN0uCEveI7eu-sZN9i0HpeS3F84ySTuFkVe4NEPbQCv5ElwrvB48Op0ZhIk3iKQ4KhsGp_X0VuvO3nqO9UoBUfo_L1wQkhAIwPJkkC5oRQpI9IVyhNSO7APnAud1xORBkojQpWQBJSrWKrDKBG-FKF3gWpZnsElwpwKqnRqZT4EVJ9KPSJSARrZiJQm0m-gh9Xaxh-lYkZskYbL48k4NmaIKzM0UN0s5cZl5So2UHNljLhyqXmsKz_mG_W74OqP2-7Qfn_yMoyHg-j5Gh0QM6nXdoM1UW1RLOEG7YnPxWxe3Nrv5huHdMF2
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Electronic+Reliability+and+Error+Performance+Analysis+of+RIS-Aided+Communication+Networks&rft.jtitle=IEEE+transactions+on+reliability&rft.au=Mondal%2C+Atiquzzaman&rft.au=Singh%2C+Keshav&rft.au=Biswas%2C+Sudip&rft.date=2025-09-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=0018-9529&rft.eissn=1558-1721&rft.volume=74&rft.issue=2&rft.spage=3708&rft.epage=3717&rft_id=info:doi/10.1109%2FTR.2024.3481231&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9529&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9529&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9529&client=summon