Mondal, A., Singh, K., & Biswas, S. (2025). Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks. IEEE transactions on reliability, 74(3), 3708-3717. https://doi.org/10.1109/TR.2024.3481231
Chicago-Zitierstil (17. Ausg.)Mondal, Atiquzzaman, Keshav Singh, und Sudip Biswas. "Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks." IEEE Transactions on Reliability 74, no. 3 (2025): 3708-3717. https://doi.org/10.1109/TR.2024.3481231.
MLA-Zitierstil (9. Ausg.)Mondal, Atiquzzaman, et al. "Electronic Reliability and Error Performance Analysis of RIS-Aided Communication Networks." IEEE Transactions on Reliability, vol. 74, no. 3, 2025, pp. 3708-3717, https://doi.org/10.1109/TR.2024.3481231.