Exact and heuristic approaches for scheduling parallel stress test machines in semiconductor reliability laboratories
We consider a parallel-machine scheduling problem motivated by stress test activities in semiconductor reliability laboratories. Unequal sizes of the jobs and ready times are possible. Several jobs can be processed at the same time on a machine if the sum of their sizes does not exceed the capacity...
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| Vydané v: | Flexible services and manufacturing journal |
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| Hlavní autori: | , , |
| Médium: | Journal Article |
| Jazyk: | English |
| Vydavateľské údaje: |
14.07.2025
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| ISSN: | 1936-6582, 1936-6590 |
| On-line prístup: | Získať plný text |
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