APA (7th ed.) Citation

Hautz, J., Klemmt, A., & Mönch, L. (2025, July 14). Exact and heuristic approaches for scheduling parallel stress test machines in semiconductor reliability laboratories. Flexible services and manufacturing journal. https://doi.org/10.1007/s10696-025-09630-9

Chicago Style (17th ed.) Citation

Hautz, Jessica, Andreas Klemmt, and Lars Mönch. "Exact and Heuristic Approaches for Scheduling Parallel Stress Test Machines in Semiconductor Reliability Laboratories." Flexible Services and Manufacturing Journal 14 Jul. 2025. https://doi.org/10.1007/s10696-025-09630-9.

MLA (9th ed.) Citation

Hautz, Jessica, et al. "Exact and Heuristic Approaches for Scheduling Parallel Stress Test Machines in Semiconductor Reliability Laboratories." Flexible Services and Manufacturing Journal, 14 Jul. 2025, https://doi.org/10.1007/s10696-025-09630-9.