Zheng, Z., Lin, W., Zhang, Y., Xiang, W., Ren, Y., Zhang, H., & Deng, X. (2025). A linear degradation model-based remaining useful life prediction framework of supercapacitors considering non-consistency of degradation trends. Engineering Research Express, 7(2), 25014-25034. https://doi.org/10.1088/2631-8695/ade5e7
Chicago Style (17th ed.) CitationZheng, Zhipeng, Wenwen Lin, Yuejun Zhang, Wei Xiang, Yaping Ren, Huaizhi Zhang, and Xiaoqiang Deng. "A Linear Degradation Model-based Remaining Useful Life Prediction Framework of Supercapacitors Considering Non-consistency of Degradation Trends." Engineering Research Express 7, no. 2 (2025): 25014-25034. https://doi.org/10.1088/2631-8695/ade5e7.
MLA (9th ed.) CitationZheng, Zhipeng, et al. "A Linear Degradation Model-based Remaining Useful Life Prediction Framework of Supercapacitors Considering Non-consistency of Degradation Trends." Engineering Research Express, vol. 7, no. 2, 2025, pp. 25014-25034, https://doi.org/10.1088/2631-8695/ade5e7.