A Metal Film Thickness Measurement System With a Large Range Based on High-Performance ME Sensors
The majority of traditional eddy current-based metal film thickness measurement systems measure the thickness of the metal film by detecting changes in the impedance or voltage of the detection coil, leading to limited measurement range and susceptibility to measurement errors caused by variations i...
Uložené v:
| Vydané v: | IEEE/ASME transactions on mechatronics s. 1 - 10 |
|---|---|
| Hlavní autori: | , , , , , , , , |
| Médium: | Journal Article |
| Jazyk: | English |
| Vydavateľské údaje: |
IEEE
2025
|
| Predmet: | |
| ISSN: | 1083-4435, 1941-014X |
| On-line prístup: | Získať plný text |
| Tagy: |
Pridať tag
Žiadne tagy, Buďte prvý, kto otaguje tento záznam!
|
Buďte prvý, kto okomentuje tento záznam!