Editorial: Introduction to the Special Issue on AI, Machine Learning, and Deep Learning: Advances and Applications for EMC

Not many technologies have ever captured the public imagination as widely and abruptly as artificial intelligence (AI). While AI has been a staple of science fiction for decades with actual applications in engineering and sciences for many years, it is only in the last year or so that generative AI...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	IEEE transactions on electromagnetic compatibility Jg. 66; H. 6; S. 1926 - 1927
Hauptverfasser:	Duffy, Alistair, Liu, En-Xiao
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	IEEE 01.12.2024
Schlagworte:	Artificial intelligence Deep learning Electromagnetic compatibility Machine learning Special issues and sections
ISSN:	0018-9375, 1558-187X
Online-Zugang:	Volltext
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