Editorial: Introduction to the Special Issue on AI, Machine Learning, and Deep Learning: Advances and Applications for EMC

Not many technologies have ever captured the public imagination as widely and abruptly as artificial intelligence (AI). While AI has been a staple of science fiction for decades with actual applications in engineering and sciences for many years, it is only in the last year or so that generative AI...

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Bibliographic Details

Published in:	IEEE transactions on electromagnetic compatibility Vol. 66; no. 6; pp. 1926 - 1927
Main Authors:	Duffy, Alistair, Liu, En-Xiao
Format:	Journal Article
Language:	English
Published:	IEEE 01.12.2024
Subjects:	Artificial intelligence Deep learning Electromagnetic compatibility Machine learning Special issues and sections
ISSN:	0018-9375, 1558-187X
Online Access:	Get full text
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