Extraction of Measurement Device Information on an ESP32 Microcontroller: TinyML for Image Processing

Convolutional neural networks (CNNs) have demonstrated outstanding results in various areas of computer vision (CV). This success has led to the possibility of using CV on ever smaller computing devices, giving rise to the research area TinyML, which enables ML tasks on, e.g. resource-constrained mi...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:Procedia computer science Ročník 246; s. 2002 - 2011
Hlavní autoři: Paul, Jonas, Schmid, Lukas, Klaiber, Marco, Rössle, Manfred
Médium: Journal Article
Jazyk:angličtina
Vydáno: Elsevier B.V 2024
Témata:
Computer Vision
ESP32
Image Regression
Microcontroller
ESP32
Computer Vision
Microcontroller
Image Regression
ISSN:1877-0509, 1877-0509
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:Convolutional neural networks (CNNs) have demonstrated outstanding results in various areas of computer vision (CV). This success has led to the possibility of using CV on ever smaller computing devices, giving rise to the research area TinyML, which enables ML tasks on, e.g. resource-constrained microcontrollers. On this basis, we extend the scope of TinyML and present an image regression task where a self-generated dataset is introduced. We compare eight different approaches with different CNN architectures and normalization methods, with the best performing model achieving an MAE of 0.54 on an ESP-32. Furthermore, the ML models used are compared in terms of their performance when used on an ESP32 and on a PC. Finally, we present open questions and further research directions based on our results.
ISSN:1877-0509
1877-0509
DOI:10.1016/j.procs.2024.09.670