APA (7th ed.) Citation

Paul, J., Schmid, L., Klaiber, M., & Rössle, M. (2024). Extraction of Measurement Device Information on an ESP32 Microcontroller: TinyML for Image Processing. Procedia computer science, 246, 2002-2011. https://doi.org/10.1016/j.procs.2024.09.670

Chicago Style (17th ed.) Citation

Paul, Jonas, Lukas Schmid, Marco Klaiber, and Manfred Rössle. "Extraction of Measurement Device Information on an ESP32 Microcontroller: TinyML for Image Processing." Procedia Computer Science 246 (2024): 2002-2011. https://doi.org/10.1016/j.procs.2024.09.670.

MLA (9th ed.) Citation

Paul, Jonas, et al. "Extraction of Measurement Device Information on an ESP32 Microcontroller: TinyML for Image Processing." Procedia Computer Science, vol. 246, 2024, pp. 2002-2011, https://doi.org/10.1016/j.procs.2024.09.670.