Kovach, S., Maksimov, O., Bhattacharya, P., & Peiris, F. (2024). Investigation of the optical properties of Pb1-xCdxTe films using spectroscopic ellipsometry. Thin solid films, 802, 140450. https://doi.org/10.1016/j.tsf.2024.140450
Citace podle Chicago (17th ed.)Kovach, Samuel, Oleg Maksimov, Pijush Bhattacharya, a Frank Peiris. "Investigation of the Optical Properties of Pb1-xCdxTe Films Using Spectroscopic Ellipsometry." Thin Solid Films 802 (2024): 140450. https://doi.org/10.1016/j.tsf.2024.140450.
Citace podle MLA (9th ed.)Kovach, Samuel, et al. "Investigation of the Optical Properties of Pb1-xCdxTe Films Using Spectroscopic Ellipsometry." Thin Solid Films, vol. 802, 2024, p. 140450, https://doi.org/10.1016/j.tsf.2024.140450.
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