APA (7th ed.) Citation

Laügt, V., Calamaz, M., & Brad, R. (2025, November 15). Automated measurement of serrated chip characteristics using image processing algorithms. International journal of advanced manufacturing technology. https://doi.org/10.1007/s00170-025-16927-4

Chicago Style (17th ed.) Citation

Laügt, Victor, Madalina Calamaz, and Remus Brad. "Automated Measurement of Serrated Chip Characteristics Using Image Processing Algorithms." International Journal of Advanced Manufacturing Technology 15 Nov. 2025. https://doi.org/10.1007/s00170-025-16927-4.

MLA (9th ed.) Citation

Laügt, Victor, et al. "Automated Measurement of Serrated Chip Characteristics Using Image Processing Algorithms." International Journal of Advanced Manufacturing Technology, 15 Nov. 2025, https://doi.org/10.1007/s00170-025-16927-4.