Laügt, V., Calamaz, M., & Brad, R. (2025, November 15). Automated measurement of serrated chip characteristics using image processing algorithms. International journal of advanced manufacturing technology. https://doi.org/10.1007/s00170-025-16927-4
Chicago-Zitierstil (17. Ausg.)Laügt, Victor, Madalina Calamaz, und Remus Brad. "Automated Measurement of Serrated Chip Characteristics Using Image Processing Algorithms." International Journal of Advanced Manufacturing Technology 15 Nov. 2025. https://doi.org/10.1007/s00170-025-16927-4.
MLA-Zitierstil (9. Ausg.)Laügt, Victor, et al. "Automated Measurement of Serrated Chip Characteristics Using Image Processing Algorithms." International Journal of Advanced Manufacturing Technology, 15 Nov. 2025, https://doi.org/10.1007/s00170-025-16927-4.