APA (7th ed.) Citation

Lukyantsev, D., Lubenchenko, A., Ivanov, D., Lubenchenko, O., & Fedotov, A. (2024). Influence of nano-sized horizontal inhomogeneities on surface profiling by means of XPS. Nauchno-tekhnicheskiĭ vestnik informat͡s︡ionnykh tekhnologiĭ, mekhaniki i optiki, 22(6), 1104-1111. https://doi.org/10.17586/2226-1494-2022-22-6-1104-1111

Chicago Style (17th ed.) Citation

Lukyantsev, D.S, A.V Lubenchenko, D.A Ivanov, O.I Lubenchenko, and A.S Fedotov. "Influence of Nano-sized Horizontal Inhomogeneities on Surface Profiling by Means of XPS." Nauchno-tekhnicheskiĭ Vestnik Informat͡s︡ionnykh Tekhnologiĭ, Mekhaniki I Optiki 22, no. 6 (2024): 1104-1111. https://doi.org/10.17586/2226-1494-2022-22-6-1104-1111.

MLA (9th ed.) Citation

Lukyantsev, D.S, et al. "Influence of Nano-sized Horizontal Inhomogeneities on Surface Profiling by Means of XPS." Nauchno-tekhnicheskiĭ Vestnik Informat͡s︡ionnykh Tekhnologiĭ, Mekhaniki I Optiki, vol. 22, no. 6, 2024, pp. 1104-1111, https://doi.org/10.17586/2226-1494-2022-22-6-1104-1111.