Model-free approach to finding index of refraction values of optical coatings from spectral measurements
Mathematical models for fitting the refractive index versus the wavelength, such as the Cauchy, Sellmeier, and Drude equations, or physical models, such as the Lorentz model, are commonly used to fit the index properties of measured spectra of optical thin film witness samples for use in the design...
Uložené v:
| Vydané v: | Applied optics. Optical technology and biomedical optics Ročník 62; číslo 28; s. 7362 |
|---|---|
| Hlavný autor: | |
| Médium: | Journal Article |
| Jazyk: | English |
| Vydavateľské údaje: |
01.10.2023
|
| ISSN: | 1559-128X, 1539-4522 |
| On-line prístup: | Zistit podrobnosti o prístupe |
| Tagy: |
Pridať tag
Žiadne tagy, Buďte prvý, kto otaguje tento záznam!
|
Buďte prvý, kto okomentuje tento záznam!