Xu, G., Wu, Q., Zhang, F., Zhao, X., Chen, Y., & Guo, S. (2025). Exploring the Internals of Fault-Induced Data-Level Vulnerabilities in Cryptographic Libraries. IEEE transactions on dependable and secure computing, 22(6), 6826-6843. https://doi.org/10.1109/TDSC.2025.3591520
Citácia podle Chicago (17th ed.)Xu, Guorui, Qianmei Wu, Fan Zhang, Xinjie Zhao, Yuan Chen, a Shize Guo. "Exploring the Internals of Fault-Induced Data-Level Vulnerabilities in Cryptographic Libraries." IEEE Transactions on Dependable and Secure Computing 22, no. 6 (2025): 6826-6843. https://doi.org/10.1109/TDSC.2025.3591520.
Citácia podľa MLA (8th ed.)Xu, Guorui, et al. "Exploring the Internals of Fault-Induced Data-Level Vulnerabilities in Cryptographic Libraries." IEEE Transactions on Dependable and Secure Computing, vol. 22, no. 6, 2025, pp. 6826-6843, https://doi.org/10.1109/TDSC.2025.3591520.