Call for Papers: Special Issue on AI, Machine Learning, and Deep Learning: Advances and Applications for EMC
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| Vydané v: | IEEE transactions on electromagnetic compatibility Ročník 65; číslo 6; s. 1939 - 1940 |
|---|---|
| Médium: | Journal Article |
| Jazyk: | English |
| Vydavateľské údaje: |
New York
IEEE
01.12.2023
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN: | 0018-9375, 1558-187X |
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| DOI | 10.1109/TEMC.2023.3324243 |
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| StartPage | 1939 |
| SubjectTerms | Deep learning Machine learning |
| Title | Call for Papers: Special Issue on AI, Machine Learning, and Deep Learning: Advances and Applications for EMC |
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