(2023). Call for Papers: Special Issue on AI, Machine Learning, and Deep Learning: Advances and Applications for EMC. IEEE transactions on electromagnetic compatibility, 65(6), 1939-1940. https://doi.org/10.1109/TEMC.2023.3324243
Chicago Style (17th ed.) Citation"Call for Papers: Special Issue on AI, Machine Learning, and Deep Learning: Advances and Applications for EMC." IEEE Transactions on Electromagnetic Compatibility 65, no. 6 (2023): 1939-1940. https://doi.org/10.1109/TEMC.2023.3324243.
MLA (9th ed.) Citation"Call for Papers: Special Issue on AI, Machine Learning, and Deep Learning: Advances and Applications for EMC." IEEE Transactions on Electromagnetic Compatibility, vol. 65, no. 6, 2023, pp. 1939-1940, https://doi.org/10.1109/TEMC.2023.3324243.
Warning: These citations may not always be 100% accurate.