APA (7th ed.) Citation

König, D., Naujoks, D., de los Arcos, T., Grosse‐Kreul, S., & Ludwig, A. (2015). X‐Ray Photoelectron Spectroscopy Investigations of the Surface Reaction Layer and its Effects on the Transformation Properties of Nanoscale Ti 51 Ni 38 Cu 11 Shape Memory Thin Films. Advanced engineering materials, 17(5), 669-673. https://doi.org/10.1002/adem.201400317

Chicago Style (17th ed.) Citation

König, Dennis, Dennis Naujoks, Teresa de los Arcos, Simon Grosse‐Kreul, and Alfred Ludwig. "X‐Ray Photoelectron Spectroscopy Investigations of the Surface Reaction Layer and Its Effects on the Transformation Properties of Nanoscale Ti 51 Ni 38 Cu 11 Shape Memory Thin Films." Advanced Engineering Materials 17, no. 5 (2015): 669-673. https://doi.org/10.1002/adem.201400317.

MLA (9th ed.) Citation

König, Dennis, et al. "X‐Ray Photoelectron Spectroscopy Investigations of the Surface Reaction Layer and Its Effects on the Transformation Properties of Nanoscale Ti 51 Ni 38 Cu 11 Shape Memory Thin Films." Advanced Engineering Materials, vol. 17, no. 5, 2015, pp. 669-673, https://doi.org/10.1002/adem.201400317.