Harikrishna, K., Nithin, A., & Davidson, M. (2025). Automated microstructural segmentation and grain size measurement of Al + SiC nanocomposites using advanced image processing techniques on backscattered electron images. Materials characterization, 222, 114845. https://doi.org/10.1016/j.matchar.2025.114845
Citace podle Chicago (17th ed.)Harikrishna, Katika, Abeyram Nithin, a M.J Davidson. "Automated Microstructural Segmentation and Grain Size Measurement of Al + SiC Nanocomposites Using Advanced Image Processing Techniques on Backscattered Electron Images." Materials Characterization 222 (2025): 114845. https://doi.org/10.1016/j.matchar.2025.114845.
Citace podle MLA (9th ed.)Harikrishna, Katika, et al. "Automated Microstructural Segmentation and Grain Size Measurement of Al + SiC Nanocomposites Using Advanced Image Processing Techniques on Backscattered Electron Images." Materials Characterization, vol. 222, 2025, p. 114845, https://doi.org/10.1016/j.matchar.2025.114845.