Yeong, M. K., & Ho, E. T. W. (2023). Recurrent neural network implementation of digital integrated circuits to mitigate challenges in design verification. Review of Computer Engineering Research, 10(3), 122-136. https://doi.org/10.18488/76.v10i3.3512
Citace podle Chicago (17th ed.)Yeong, Ming Keat, a Eric Tatt Wei Ho. "Recurrent Neural Network Implementation of Digital Integrated Circuits to Mitigate Challenges in Design Verification." Review of Computer Engineering Research 10, no. 3 (2023): 122-136. https://doi.org/10.18488/76.v10i3.3512.
Citace podle MLA (9th ed.)Yeong, Ming Keat, a Eric Tatt Wei Ho. "Recurrent Neural Network Implementation of Digital Integrated Circuits to Mitigate Challenges in Design Verification." Review of Computer Engineering Research, vol. 10, no. 3, 2023, pp. 122-136, https://doi.org/10.18488/76.v10i3.3512.