Yeong, M. K., & Ho, E. T. W. (2023). Recurrent neural network implementation of digital integrated circuits to mitigate challenges in design verification. Review of Computer Engineering Research, 10(3), 122-136. https://doi.org/10.18488/76.v10i3.3512
Chicago Style (17th ed.) CitationYeong, Ming Keat, and Eric Tatt Wei Ho. "Recurrent Neural Network Implementation of Digital Integrated Circuits to Mitigate Challenges in Design Verification." Review of Computer Engineering Research 10, no. 3 (2023): 122-136. https://doi.org/10.18488/76.v10i3.3512.
MLA (9th ed.) CitationYeong, Ming Keat, and Eric Tatt Wei Ho. "Recurrent Neural Network Implementation of Digital Integrated Circuits to Mitigate Challenges in Design Verification." Review of Computer Engineering Research, vol. 10, no. 3, 2023, pp. 122-136, https://doi.org/10.18488/76.v10i3.3512.