FUZYE: A Fuzzy -Means Analog IC Yield Optimization Using Evolutionary-Based Algorithms

This paper presents fuzzy c-means-based yield estimation (FUZYE), a methodology that reduces the time impact caused by Monte Carlo (MC) simulations in the context of analog integrated circuits (ICs) yield estimation, enabling it for yield optimization with population-based algorithms, e.g., the gene...

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Bibliographic Details
Published in:	IEEE transactions on computer-aided design of integrated circuits and systems Vol. 39; no. 1; pp. 1 - 13
Main Authors:	Canelas, Antonio, Povoa, Ricardo, Martins, Ricardo, Lourenco, Nuno, Guilherme, Jorge, Carvalho, Joao Paulo, Horta, Nuno
Format:	Journal Article
Language:	English
Published:	New York IEEE 01.01.2020 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	Algorithms Analog circuits analog IC yield estimation Analog integrated circuit (IC) synthesis Analytical models circuit optimization Clustering clustering algorithms Computer simulation Evolutionary algorithms expensive simulations Genetic algorithms Integrated circuit modeling Integrated circuits Monte Carlo (MC) analysis Optimization Population Simulation Sociology Statistics Yield estimation
ISSN:	0278-0070, 1937-4151
Online Access:	Get full text
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