Govind, K., Oliveros, D., Dlouhy, A., Legros, M., & Sandfeld, S. (2023, July 12). Deep Learning of Crystalline Defects from TEM images: A Solution for the Problem of" Never Enough Training Data". Machine learning: science and technology. https://doi.org/10.48550/arXiv.2307.06322
Citácia podle Chicago (17th ed.)Govind, Kishan, Daniela Oliveros, Antonin Dlouhy, Marc Legros, a Stefan Sandfeld. "Deep Learning of Crystalline Defects from TEM Images: A Solution for the Problem of" Never Enough Training Data"." Machine Learning: Science and Technology 12 Jul. 2023. https://doi.org/10.48550/arXiv.2307.06322.
Citácia podľa MLA (8th ed.)Govind, Kishan, et al. "Deep Learning of Crystalline Defects from TEM Images: A Solution for the Problem of" Never Enough Training Data"." Machine Learning: Science and Technology, 12 Jul. 2023, https://doi.org/10.48550/arXiv.2307.06322.