Reduction of Charge Traps and Stability Enhancement in Solution-Processed Organic Field-Effect Transistors Based on a Blended n-type Semiconductor

Solution-processed n-type organic field-effect transistors (OFETs) are essential elements for developing large-area, low-cost, and all organic logic/complementary circuits. Nonetheless, the development of air-stable n-type organic semiconductors (OSC) lags behind their p-type counterparts. The trapp...

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Vydáno v:ACS applied materials & interfaces Ročník 10; číslo 18; s. 15952
Hlavní autoři: Campos, Antonio, Riera-Galindo, Sergi, Puigdollers, Joaquim, Mas-Torrent, Marta
Médium: Journal Article
Jazyk:angličtina
Vydáno: United States 09.05.2018
ISSN:1944-8252, 1944-8252
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Shrnutí:Solution-processed n-type organic field-effect transistors (OFETs) are essential elements for developing large-area, low-cost, and all organic logic/complementary circuits. Nonetheless, the development of air-stable n-type organic semiconductors (OSC) lags behind their p-type counterparts. The trapping of electrons at the semiconductor-dielectric interface leads to a lower performance and operational stability. Herein we report printed small molecule n-type OFETs based on a blend with a binder polymer, which enhances the device stability due to the improvement of the semiconductor-dielectric interface quality and a self-encapsulation. Both combined effects prevent the fast oxidation of the OSC. Additionally, a CMOS-like inverter is fabricated depositing a p-type and n-type OSCs simultaneously.
Bibliografie:ObjectType-Article-1
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ISSN:1944-8252
1944-8252
DOI:10.1021/acsami.8b02851