Fringe pattern analysis for optical metrology : theory, algorithms, and applications

Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe patte...

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Hlavní autori:	Servín, Manuel, Quiroga, J. Antonio, Padilla, J. Moisés
Médium:	E-kniha Kniha
Jazyk:	English
Vydavateľské údaje:	Weinheim Wiley-VCH 2014 Wiley John Wiley & Sons, Incorporated
Vydanie:	1
Predmet:	(BISAC Subject Heading)SCI021000 (Produktform)Hardback (VLB-Produktgruppen)TN000 (VLB-WN)1643: Hardcover, Softcover / Physik, Astronomie/Elektrizität, Magnetismus, Optik Data processing Diffraction patterns Interferometry Interferometry > Mathematical models Messtechnik Optical measurements Optical measurements > Mathematical models Optik Optische Messtechnik TECHNOLOGY & ENGINEERING
ISBN:	9783527411528, 3527411526, 9783527681105, 3527681108
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